"HardTaint: Production-Run Dynamic Taint Analysis via Selective Hardware ..."

Yiyu Zhang et al. (2024)

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DOI: 10.1145/3689768

access: open

type: Journal Article

metadata version: 2025-01-19

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Yiyu Zhang, Tianyi Liu, Yueyang Wang, Yun Qi, Kai Ji, Jian Tang, Xiaoliang Wang, Xuandong Li, Zhiqiang Zuo:
HardTaint: Production-Run Dynamic Taint Analysis via Selective Hardware Tracing. Proc. ACM Program. Lang. 8(OOPSLA2): 1615-1640 (2024)

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