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"The challenge of signal integrity in deep-submicrometer CMOS technology."

Fabrice Caignet, Sonia Delmas-Bendhia, Etienne Sicard (2001)

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DOI: 10.1109/5.920583

access: closed

type: Journal Article

metadata version: 2021-08-17

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  - journals/pieee/CaignetDS01
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  - https://dblp.org/rec/journals/pieee/CaignetDS01
Fabrice Caignet, Sonia Delmas-Bendhia, Etienne Sicard:
The challenge of signal integrity in deep-submicrometer CMOS technology. Proc. IEEE 89(4): 556-573 (2001)

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