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"Pattern clustering based on noise modeling in wavelet space."

Fionn Murtagh, Jean-Luc Starck (1998)

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DOI: 10.1016/S0031-3203(97)00115-5

access: closed

type: Journal Article

metadata version: 2020-02-24

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  - journals/pr/MurtaghS98
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  - https://dblp.org/rec/journals/pr/MurtaghS98
Fionn Murtagh, Jean-Luc Starck:
Pattern clustering based on noise modeling in wavelet space. Pattern Recognit. 31(7): 847-855 (1998)

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