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"Accumulated and aggregated shifting of intensity for defect detection on ..."

Yaping Yan, Shun'ichi Kaneko, Hirokazu Asano (2020)

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DOI: 10.1016/J.PATCOG.2019.107057

access: closed

type: Journal Article

metadata version: 2020-02-24

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Yaping Yan, Shun'ichi Kaneko, Hirokazu Asano:
Accumulated and aggregated shifting of intensity for defect detection on micro 3D textured surfaces. Pattern Recognit. 98 (2020)

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