"Automatic detection of Mura defect in TFT-LCD based on regression diagnostics."

Shu-Kai S. Fan, Yu-Chiang Chuang (2010)

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DOI: 10.1016/J.PATREC.2010.07.013

access: closed

type: Journal Article

metadata version: 2020-02-22

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Shu-Kai S. Fan, Yu-Chiang Chuang:
Automatic detection of Mura defect in TFT-LCD based on regression diagnostics. Pattern Recognit. Lett. 31(15): 2397-2404 (2010)

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