"Characterization of contour regularities based on the Levenshtein edit ..."

José Ignacio Abreu Salas, Juan Ramón Rico-Juan (2011)

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DOI: 10.1016/J.PATREC.2011.03.021

access: closed

type: Journal Article

metadata version: 2020-09-05

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José Ignacio Abreu Salas, Juan Ramón Rico-Juan:
Characterization of contour regularities based on the Levenshtein edit distance. Pattern Recognit. Lett. 32(10): 1421-1427 (2011)

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