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"Reliability Assessment of Metallized Film Capacitors using Reduced ..."

Quan Sun et al. (2013)

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DOI: 10.1002/QRE.1307

access: closed

type: Journal Article

metadata version: 2020-07-09

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Quan Sun, Yanzhen Tang, Jing Feng, Tongdan Jin:
Reliability Assessment of Metallized Film Capacitors using Reduced Degradation Test Sample. Qual. Reliab. Eng. Int. 29(2): 259-265 (2013)

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