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"Performance evaluation of delay testable enhanced scan flip-flop."

Ashok Kumar Suhag, Vivek Shrivastava (2012)

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DOI: 10.1007/S13198-012-0124-7

access: closed

type: Journal Article

metadata version: 2023-05-01

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Ashok Kumar Suhag, Vivek Shrivastava:
Performance evaluation of delay testable enhanced scan flip-flop. Int. J. Syst. Assur. Eng. Manag. 3(3): 169-174 (2012)

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