"How to characterize patent quality with multiple indicators? Evidence ..."

Jia Lin, Howei Wu, Ho-Mou Wu (2025)

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DOI: 10.1007/S11192-025-05401-3

access: closed

type: Journal Article

metadata version: 2025-09-11

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Jia Lin, Howei Wu, Ho-Mou Wu:
How to characterize patent quality with multiple indicators? Evidence based on economic performance of Chinese companies. Scientometrics 130(8): 4249-4281 (2025)

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