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"Patent citation analysis in a novel field of technology: An exploration of ..."

Martin S. Meyer (2001)

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DOI: 10.1023/A:1010572914033

access: closed

type: Journal Article

metadata version: 2020-07-17

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  - https://dblp.org/rec/journals/scientometrics/Meyer01
Martin S. Meyer:
Patent citation analysis in a novel field of technology: An exploration of nano-science and nano-technology. Scientometrics 51(1): 163-183 (2001)

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