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"A study on fault detection for IC boards using thermography."

Satoshi Nishino, Kenji Ohshima (1998)

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DOI: 10.1002/(SICI)1520-684X(199805)29:5<49::AID-SCJ6>3.0.CO;2-N

access: closed

type: Journal Article

metadata version: 2023-09-13

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Satoshi Nishino, Kenji Ohshima:
A study on fault detection for IC boards using thermography. Syst. Comput. Jpn. 29(5): 49-61 (1998)

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