"Software reliability growth model for testing-domain."

Hiroshi Ohtera, Shigeru Yamada, Hiroyuki Narihisa (1991)

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DOI: 10.1002/SCJ.4690220203

access: closed

type: Journal Article

metadata version: 2023-09-13

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Hiroshi Ohtera, Shigeru Yamada, Hiroyuki Narihisa:
Software reliability growth model for testing-domain. Syst. Comput. Jpn. 22(2): 19-24 (1991)

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