"Defect Imaging Enhancement through Optimized Shape Factors of the RAPID ..."

Yonghee Lee, Younho Cho (2021)

> Home

Details and statistics

DOI: 10.3390/S21124029

access: open

type: Journal Article

metadata version: 2022-10-02

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/sensors/LeeC21a
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/sensors/LeeC21a
Yonghee Lee, Younho Cho:
Defect Imaging Enhancement through Optimized Shape Factors of the RAPID Algorithm Based on Guided Wave Beam Pattern Analysis. Sensors 21(12): 4029 (2021)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.