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"Noise Improvement of a-Si Microbolometers by the Post-Metal Annealing Process."
Jaesub Oh et al. (2021)
- Jaesub Oh, Hyeong-sub Song, Jongcheol Park

, Jong-Kwon Lee:
Noise Improvement of a-Si Microbolometers by the Post-Metal Annealing Process. Sensors 21(20): 6722 (2021)

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