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"Reconstruction of Semiconductor Doping Profile from Laser-Beam-Induced ..."

Weifu Fang, Kazufumi Ito (1994)

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DOI: 10.1137/S0036139992234804

access: closed

type: Journal Article

metadata version: 2020-05-20

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  - journals/siamam/FangI94
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  - https://dblp.org/rec/journals/siamam/FangI94
Weifu Fang, Kazufumi Ito:
Reconstruction of Semiconductor Doping Profile from Laser-Beam-Induced Current Image. SIAM J. Appl. Math. 54(4): 1067-1082 (1994)

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