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"Parameter Identification for Semiconductor Diodes by LBIC Imaging."

David A. Redfern, Kazufumi Ito, Weifu Fang (2002)

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DOI: 10.1137/S003613990139249X

access: closed

type: Journal Article

metadata version: 2020-05-20

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  dblp key:
  - journals/siamam/RedfernIF02
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  - https://dblp.org/rec/journals/siamam/RedfernIF02
David A. Redfern, Kazufumi Ito, Weifu Fang:
Parameter Identification for Semiconductor Diodes by LBIC Imaging. SIAM J. Appl. Math. 62(6): 2149-2174 (2002)

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