"Test generation algorithm for analog systems based on support vector machine."

Ting Long, Houjun Wang, Bing Long (2011)

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DOI: 10.1007/S11760-010-0168-6

access: closed

type: Journal Article

metadata version: 2020-09-06

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Ting Long, Houjun Wang, Bing Long:
Test generation algorithm for analog systems based on support vector machine. Signal Image Video Process. 5(4): 527-533 (2011)

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