"Cross-company defect prediction via semi-supervised clustering-based data ..."

Xiao Yu et al. (2018)

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DOI: 10.1007/S00500-018-3093-1

access: closed

type: Journal Article

metadata version: 2025-01-19

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Xiao Yu, Man Wu, Yiheng Jian, Kwabena Ebo Bennin, Mandi Fu, Chuanxiang Ma:
Cross-company defect prediction via semi-supervised clustering-based data filtering and MSTrA-based transfer learning. Soft Comput. 22(10): 3461-3472 (2018)

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