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"Special Issue: IEEE International Conference on Software Testing, ..."

Robert Feldt, Shin Yoo (2021)

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DOI: 10.1002/STVR.1764

access: closed

type: Journal Article

metadata version: 2021-02-10

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Robert Feldt, Shin Yoo:
Special Issue: IEEE International Conference on Software Testing, Validation & Verification 2018. Softw. Test. Verification Reliab. 31(1-2) (2021)

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