"Design of a Triple-Node-Upset Self-Recoverable Latch for Aerospace ..."

Aibin Yan et al. (2020)

> Home

Details and statistics

DOI: 10.1109/TAES.2019.2925448

access: closed

type: Journal Article

metadata version: 2020-05-04

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/taes/YanFHLCCMW20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/taes/YanFHLCCMW20
Aibin Yan, Xiangfeng Feng, Yuanjie Hu, Chaoping Lai, Jie Cui, Zhili Chen, Kohei Miyase, Xiaoqing Wen:
Design of a Triple-Node-Upset Self-Recoverable Latch for Aerospace Applications in Harsh Radiation Environments. IEEE Trans. Aerosp. Electron. Syst. 56(2): 1163-1171 (2020)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.