"Functional Test Generation for Digital Circuits Described Using Binary ..."

Magdy S. Abadir, Hassan K. Reghbati (1986)

Details and statistics

DOI: 10.1109/TC.1986.1676774

access: closed

type: Journal Article

metadata version: 2017-05-20

a service of  Schloss Dagstuhl - Leibniz Center for Informatics