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"Concurrent Application of Compaction and Compression for Test Time and ..."
Ismet Bayraktaroglu, Alex Orailoglu (2003)
- Ismet Bayraktaroglu, Alex Orailoglu:
Concurrent Application of Compaction and Compression for Test Time and Data Volume Reduction in Scan Designs. IEEE Trans. Computers 52(11): 1480-1489 (2003)
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