default search action
"Test Generation for Path Delay Faults Using Binary Decision Diagrams."
Debashis Bhattacharya, Prathima Agrawal, Vishwani D. Agrawal (1995)
- Debashis Bhattacharya, Prathima Agrawal, Vishwani D. Agrawal:
Test Generation for Path Delay Faults Using Binary Decision Diagrams. IEEE Trans. Computers 44(3): 434-447 (1995)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.