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"9-V Algorithm for Test Pattern Generation of Combinational Digital Circuits."

Charles W. Cha, William E. Donath, Füsun Özgüner (1978)

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DOI: 10.1109/TC.1978.1675071

access: closed

type: Journal Article

metadata version: 2017-05-20

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/journals/tc/ChaDO78
Charles W. Cha, William E. Donath, Füsun Özgüner:
9-V Algorithm for Test Pattern Generation of Combinational Digital Circuits. IEEE Trans. Computers 27(3): 193-200 (1978)

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