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ORCID"Low-Transition Test Pattern Generation for BIST-Based Applications."
Mehrdad Nourani, Mohammad Tehranipoor, Nisar Ahmed (2008)
- Mehrdad Nourani, Mohammad Tehranipoor, Nisar Ahmed:
Low-Transition Test Pattern Generation for BIST-Based Applications. IEEE Trans. Computers 57(3): 303-315 (2008)
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