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"A Storage-Based Built-In Test Pattern Generation Method for Scan Circuits ..."
Irith Pomeranz, Sudhakar M. Reddy (2002)
- Irith Pomeranz, Sudhakar M. Reddy:
A Storage-Based Built-In Test Pattern Generation Method for Scan Circuits Based on Partitioning and Reduction of a Precomputed Test Set. IEEE Trans. Computers 51(11): 1282-1293 (2002)
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