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"Test Procedures for a Class of Pattern-Sensitive Faults in Semiconductor ..."

Dong S. Suk, Sudhakar M. Reddy (1980)

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DOI: 10.1109/TC.1980.1675601

access: closed

type: Journal Article

metadata version: 2017-05-20

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  persistent URL:
  - https://dblp.org/rec/journals/tc/SukR80
Dong S. Suk, Sudhakar M. Reddy:
Test Procedures for a Class of Pattern-Sensitive Faults in Semiconductor Random-Access Memories. IEEE Trans. Computers 29(6): 419-429 (1980)

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