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"An Efficient Scan Tree Design for Compact Test Pattern Set."

Shibaji Banerjee, Dipanwita Roy Chowdhury, Bhargab B. Bhattacharya (2007)

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DOI: 10.1109/TCAD.2007.895840

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - journals/tcad/BanerjeeCB07
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  - https://dblp.org/rec/journals/tcad/BanerjeeCB07
Shibaji Banerjee, Dipanwita Roy Chowdhury, Bhargab B. Bhattacharya:
An Efficient Scan Tree Design for Compact Test Pattern Set. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 26(7): 1331-1339 (2007)

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