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"Designing for high-level test generation."

Debashis Bhattacharya, John P. Hayes (1990)

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DOI: 10.1109/43.55212

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - journals/tcad/BhattacharyaH90
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  - https://dblp.org/rec/journals/tcad/BhattacharyaH90
Debashis Bhattacharya, John P. Hayes:
Designing for high-level test generation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 9(7): 752-766 (1990)

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