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"Necessary and sufficient conditions for hazard-free robust transistor ..."

Michael J. Bryan, Srinivas Devadas, Kurt Keutzer (1992)

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DOI: 10.1109/43.137525

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/tcad/BryanDK92
Michael J. Bryan, Srinivas Devadas, Kurt Keutzer:
Necessary and sufficient conditions for hazard-free robust transistor stuck-open-fault testability in multilevel networks. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 11(6): 800-803 (1992)

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