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"Benchmarking of Mask Fracturing Heuristics."

Tuck-Boon Chan et al. (2017)

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DOI: 10.1109/TCAD.2016.2620902

access: closed

type: Journal Article

metadata version: 2021-10-28

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  - https://dblp.org/rec/journals/tcad/ChanGHKK17
Tuck-Boon Chan, Puneet Gupta, Kwangsoo Han, Abde Ali Kagalwalla, Andrew B. Kahng:
Benchmarking of Mask Fracturing Heuristics. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36(1): 170-183 (2017)

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