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"Robust Simulation Methodology for Surface-Roughness Loss in Interconnect ..."

Quan Chen, Hoi Wai Choi, Ngai Wong (2009)

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DOI: 10.1109/TCAD.2009.2030408

access: closed

type: Journal Article

metadata version: 2024-02-05

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Quan Chen, Hoi Wai Choi, Ngai Wong:
Robust Simulation Methodology for Surface-Roughness Loss in Interconnect and Package Modelings. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(11): 1654-1665 (2009)

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