"An efficient test relaxation technique for synchronous sequential circuits."

Aiman H. El-Maleh, Khaled Al-Utaibi (2004)

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DOI: 10.1109/TCAD.2004.828110

access: closed

type: Journal Article

metadata version: 2022-12-07

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Aiman H. El-Maleh, Khaled Al-Utaibi:
An efficient test relaxation technique for synchronous sequential circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 23(6): 933-940 (2004)

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