"Linked faults in random access memories: concept, fault models, test ..."

Said Hamdioui et al. (2004)

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DOI: 10.1109/TCAD.2004.826578

access: closed

type: Journal Article

metadata version: 2020-09-24

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Said Hamdioui, Zaid Al-Ars, Ad J. van de Goor, Mike Rodgers:
Linked faults in random access memories: concept, fault models, test algorithms, and industrial results. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 23(5): 737-757 (2004)

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