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"Test-Suite-Based Analog/RF Test Time Reduction Using Canonical Correlation."

Ke Huang, Jian Wen, Jim Willmore (2016)

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DOI: 10.1109/TCAD.2016.2547904

access: closed

type: Journal Article

metadata version: 2023-03-03

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Ke Huang, Jian Wen, Jim Willmore:
Test-Suite-Based Analog/RF Test Time Reduction Using Canonical Correlation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35(12): 2143-2147 (2016)

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