"Path-delay-fault testable nonscan sequential circuits."

Wuudiann Ke, Premachandran R. Menon (1995)

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DOI: 10.1109/43.384419

access: closed

type: Journal Article

metadata version: 2020-09-24

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Wuudiann Ke, Premachandran R. Menon:
Path-delay-fault testable nonscan sequential circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 14(5): 576-582 (1995)

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