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"Analytical CAD Models for the Signal Transients and Crosstalk Noise of ..."

Taehoon Kim, Yungseon Eo (2008)

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DOI: 10.1109/TCAD.2008.923094

access: closed

type: Journal Article

metadata version: 2020-09-24

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Taehoon Kim, Yungseon Eo:
Analytical CAD Models for the Signal Transients and Crosstalk Noise of Inductance-Effect-Prominent Multicoupled RLC Interconnect Lines. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(7): 1214-1227 (2008)

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