"Circular self-test path: a low-cost BIST technique for VLSI circuits."

Andrzej Krasniewski, Slawomir Pilarski (1989)

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DOI: 10.1109/43.21818

access: closed

type: Journal Article

metadata version: 2021-10-14

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Andrzej Krasniewski, Slawomir Pilarski:
Circular self-test path: a low-cost BIST technique for VLSI circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 8(1): 46-55 (1989)

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