"Design and test rules for CMOS circuits to facilitate IDDQ testing of ..."

Kuen-Jong Lee, Melvin A. Breuer (1992)

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DOI: 10.1109/43.127626

access: closed

type: Journal Article

metadata version: 2020-09-24

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Kuen-Jong Lee, Melvin A. Breuer:
Design and test rules for CMOS circuits to facilitate IDDQ testing of bridging faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 11(5): 659-670 (1992)

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