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"Capture-Power-Safe Test Pattern Determination for At-Speed Scan-Based Testing."

Yi-Hua Li et al. (2014)

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DOI: 10.1109/TCAD.2013.2282281

access: closed

type: Journal Article

metadata version: 2021-10-14

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  - https://dblp.org/rec/journals/tcad/LiLLL14
Yi-Hua Li, Wei-Cheng Lien, Ing-Chao Lin, Kuen-Jong Lee:
Capture-Power-Safe Test Pattern Determination for At-Speed Scan-Based Testing. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 33(1): 127-138 (2014)

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