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"Longest-path selection for delay test under process variation."

Xiang Lu et al. (2005)

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DOI: 10.1109/TCAD.2005.852674

access: closed

type: Journal Article

metadata version: 2020-09-24

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Xiang Lu, Zhuo Li, Wangqi Qiu, D. M. H. Walker, Weiping Shi:
Longest-path selection for delay test under process variation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 24(12): 1924-1929 (2005)

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