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"A SAT Based Test Generation Method for Delay Fault Testing of Macro Based ..."

Santino Mele, Michele Favalli (2011)

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DOI: 10.1109/TCAD.2010.2093290

access: closed

type: Journal Article

metadata version: 2020-09-24

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Santino Mele, Michele Favalli:
A SAT Based Test Generation Method for Delay Fault Testing of Macro Based Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 30(4): 631-635 (2011)

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