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"Star-EDT: Deterministic On-Chip Scheme Using Compressed Test Patterns."

Grzegorz Mrugalski et al. (2017)

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DOI: 10.1109/TCAD.2016.2597214

access: closed

type: Journal Article

metadata version: 2022-06-22

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  - journals/tcad/MrugalskiRRST17
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  - https://dblp.org/rec/journals/tcad/MrugalskiRRST17
Grzegorz Mrugalski, Janusz Rajski, Lukasz Rybak, Jedrzej Solecki, Jerzy Tyszer:
Star-EDT: Deterministic On-Chip Scheme Using Compressed Test Patterns. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36(4): 683-693 (2017)

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