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"A Genetic Algorithm-Based Heuristic Method for Test Set Generation in ..."

A. N. Nagamani et al. (2018)

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DOI: 10.1109/TCAD.2017.2695881

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/tcad/NagamaniANA18
A. N. Nagamani, S. N. Anuktha, N. Nanditha, Vinod Kumar Agrawal:
A Genetic Algorithm-Based Heuristic Method for Test Set Generation in Reversible Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(2): 324-336 (2018)

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