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"An extension of probabilistic simulation for reliability analysis of CMOS ..."

Farid N. Najm, Ibrahim N. Hajj, Ping Yang (1991)

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DOI: 10.1109/43.97616

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/tcad/NajmHY91
Farid N. Najm, Ibrahim N. Hajj, Ping Yang:
An extension of probabilistic simulation for reliability analysis of CMOS VLSI circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 10(11): 1372-1381 (1991)

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