"On the use of random limited-scan to improve at-speed randompattern ..."

Irith Pomeranz (2002)

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DOI: 10.1109/TCAD.2002.801092

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type: Journal Article

metadata version: 2020-09-24

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Irith Pomeranz:
On the use of random limited-scan to improve at-speed randompattern testing of scan circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 21(9): 1068-1076 (2002)

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