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"Input Test Data Volume Reduction for Skewed-Load Tests by Additional ..."

Irith Pomeranz (2014)

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DOI: 10.1109/TCAD.2013.2290085

access: closed

type: Journal Article

metadata version: 2020-09-24

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Irith Pomeranz:
Input Test Data Volume Reduction for Skewed-Load Tests by Additional Shifting of Scan-In States. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 33(4): 638-642 (2014)

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