"Autonomous Multicycle Tests With Low Storage and Test Application Time ..."

Irith Pomeranz (2018)

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DOI: 10.1109/TCAD.2017.2774269

access: closed

type: Journal Article

metadata version: 2020-09-24

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Irith Pomeranz:
Autonomous Multicycle Tests With Low Storage and Test Application Time Overheads. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(9): 1881-1892 (2018)

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