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"Vector replacement to improve static-test compaction forsynchronous ..."

Irith Pomeranz, Sudhakar M. Reddy (2001)

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DOI: 10.1109/43.908476

access: closed

type: Journal Article

metadata version: 2020-09-24

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Irith Pomeranz, Sudhakar M. Reddy:
Vector replacement to improve static-test compaction forsynchronous sequential circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 20(2): 336-342 (2001)

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