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"Property-based test generation for scan designs and the effects ofthe test ..."

Irith Pomeranz, Sudhakar M. Reddy (2002)

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DOI: 10.1109/43.998633

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/tcad/PomeranzR02
Irith Pomeranz, Sudhakar M. Reddy:
Property-based test generation for scan designs and the effects ofthe test application scheme and scan selection on the number ofdetectable faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 21(5): 628-637 (2002)

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